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Includes in-depth analysis on how to optimize X-ray detection;
Discusses analysis of electronics for X-ray detection.
Includes in-depth analysis on how to optimize X-ray detection;
Discusses analysis of electronics for X-ray detection.
Scott Hsieh is an assistant professor at the Mayo Clinic whose research includes modeling and development of photon counting detectors. His past contributions to photon counting include theory for circuit designs that could reduce dose and improve contrast, and simulations to define application requirements. Previously, he was a faculty member at UCLA and an instructor at Stanford. He is a named inventor on 13 issued U.S. utility patents.
Krzysztof (Kris) Iniewski is a director of detector architecture and applications at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 16 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. He has published over 150+ research papers in international journals and conferences. He holds 25+international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer.| Erscheinungsjahr: | 2024 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| Inhalt: |
vii
277 S. 1 s/w Illustr. 277 p. 1 illus. |
| ISBN-13: | 9783031260643 |
| ISBN-10: | 3031260643 |
| Sprache: | Englisch |
| Einband: | Kartoniert / Broschiert |
| Redaktion: |
Iniewski, Krzysztof (Kris)
Hsieh, Scott |
| Herausgeber: | Scott Hsieh/Krzysztof (Kris) Iniewski |
| Hersteller: |
Springer Nature Switzerland
Springer International Publishing |
| Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
| Maße: | 235 x 155 x 16 mm |
| Von/Mit: | Krzysztof Iniewski (u. a.) |
| Erscheinungsdatum: | 28.05.2024 |
| Gewicht: | 0,441 kg |
Scott Hsieh is an assistant professor at the Mayo Clinic whose research includes modeling and development of photon counting detectors. His past contributions to photon counting include theory for circuit designs that could reduce dose and improve contrast, and simulations to define application requirements. Previously, he was a faculty member at UCLA and an instructor at Stanford. He is a named inventor on 13 issued U.S. utility patents.
Krzysztof (Kris) Iniewski is a director of detector architecture and applications at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 16 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. He has published over 150+ research papers in international journals and conferences. He holds 25+international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer.| Erscheinungsjahr: | 2024 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| Inhalt: |
vii
277 S. 1 s/w Illustr. 277 p. 1 illus. |
| ISBN-13: | 9783031260643 |
| ISBN-10: | 3031260643 |
| Sprache: | Englisch |
| Einband: | Kartoniert / Broschiert |
| Redaktion: |
Iniewski, Krzysztof (Kris)
Hsieh, Scott |
| Herausgeber: | Scott Hsieh/Krzysztof (Kris) Iniewski |
| Hersteller: |
Springer Nature Switzerland
Springer International Publishing |
| Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
| Maße: | 235 x 155 x 16 mm |
| Von/Mit: | Krzysztof Iniewski (u. a.) |
| Erscheinungsdatum: | 28.05.2024 |
| Gewicht: | 0,441 kg |
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