Almut Böer-Auer is Dermatopathologist and Director of Academics at the Dermatologikum Hamburg, Germany and Associate Professor in Dermatology at Münster University in Germany. She has been interested in histopathologic pattern diagnosis of skin diseases for almost two decades. One of her research focuses is identification and validation of diagnostic patterns by correlation with ancillary methods like molecular diagnostics. She has authored and coauthored many scientific articles and textbook chapters and is devoted to teaching dermatopathology nationally and internationally.

Harald Kittler is Associate Professor of Dermatology at the Department of Dermatology, Medical University of Vienna, in Vienna/Austria with a subspecialisation in dermatopathology. His special clinical interest resides in the diagnosis of melanocytic skin lesions. His main research interest is digital dermoscopy, follow-up of pigmented skin lesions, computer assisted digital dermoscopy., and dermatopathology. Dr. Kittler has been working for over 20 years in the field of dermoscopy and dermatopathology and has been lecturing and publishing a large number of scientific articles.

Philipp Tschandl is Assistant Professor of Dermatology with a subspecialization in dermatopathology, and managing director of the dermatopathology laboratory at the Department of Dermatology, Medical University of Vienna in Austria. He has published research on growth dynamics of melanoma, melanoma association with pre-existing nevi, as well as early detection of melanoma with dermatoscopy. Recent work of his also includes the application of artificial intelligence alone and in collaboration with physicians for improving medical diagnoses and decision-making.

Book specifically focused on pattern analysis of melanocytic lesions

Gives Clinical, dermatoscopic, pathologic and molecular correlations for an updated, integrated classification

A wealth of high resolution, original illustrations to support dermatopathologists and dermatoscopists

Introduction.- Historical perspective.- Classifications.- Pattern analysis.- Integration of patterns.- Integration of context.- Pattern analysis in practice.- Bias, Noise, and Error.