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Cover: 9780387231167 | Introduction to Focused Ion Beams | Lucille A. Giannuzzi | Buch | xvii
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Introduction to Focused Ion Beams
Instrumentation, Theory, Techniques and Practice
Buch von Lucille A. Giannuzzi
Sprache: Englisch

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Beschreibung
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Zusammenfassung

Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments

Inhaltsverzeichnis
The Focused Ion Beam Instrument.- Ion - Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications - a Review.- Practical Aspects of FIB Tem Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Application of FIB in Combination with Auger Electron Spectroscopy.
Details
Erscheinungsjahr: 2004
Fachbereich: Elektrizität/Magnetismus/Optik
Genre: Importe, Physik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: xvii
357 S.
6 s/w Illustr.
28 farbige Illustr.
357 p. 34 illus.
28 illus. in color.
ISBN-13: 9780387231167
ISBN-10: 0387231161
Sprache: Englisch
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Redaktion: Giannuzzi, Lucille A.
Herausgeber: Lucille A Giannuzzi/North Carolina State University Center for the Bio
logy of
Hersteller: Springer US
Springer US, New York, N.Y.
Verantwortliche Person für die EU: Books on Demand GmbH, In de Tarpen 42, D-22848 Norderstedt, info@bod.de
Maße: 241 x 160 x 26 mm
Von/Mit: Lucille A. Giannuzzi
Erscheinungsdatum: 19.11.2004
Gewicht: 0,729 kg
Artikel-ID: 102377729
Zusammenfassung

Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments

Inhaltsverzeichnis
The Focused Ion Beam Instrument.- Ion - Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications - a Review.- Practical Aspects of FIB Tem Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Application of FIB in Combination with Auger Electron Spectroscopy.
Details
Erscheinungsjahr: 2004
Fachbereich: Elektrizität/Magnetismus/Optik
Genre: Importe, Physik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: xvii
357 S.
6 s/w Illustr.
28 farbige Illustr.
357 p. 34 illus.
28 illus. in color.
ISBN-13: 9780387231167
ISBN-10: 0387231161
Sprache: Englisch
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Redaktion: Giannuzzi, Lucille A.
Herausgeber: Lucille A Giannuzzi/North Carolina State University Center for the Bio
logy of
Hersteller: Springer US
Springer US, New York, N.Y.
Verantwortliche Person für die EU: Books on Demand GmbH, In de Tarpen 42, D-22848 Norderstedt, info@bod.de
Maße: 241 x 160 x 26 mm
Von/Mit: Lucille A. Giannuzzi
Erscheinungsdatum: 19.11.2004
Gewicht: 0,729 kg
Artikel-ID: 102377729
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